Igor A. Kharitonov

According to our database, Igor A. Kharitonov authored at least 16 papers between 1995 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2021

SPICE Compact BJT, MOSFET, and JFET Models for ICs Simulation in the Wide Temperature Range (From -200 °C to +300 °C).

Konstantin O. Petrosyants, Lev M. Sambursky, Maxim V. Kozhukhov, Mamed R. Ismail-Zade, Igor A. Kharitonov, Bo Li

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

2018

SPICE Simulation of Total Dose and Aging Effects in MOSFET Circuits.

Konstantin O. Petrosyants, Igor A. Kharitonov

Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018

2017

Electrical characterization and reliability of submicron SOI CMOS technology in the extended temperature range (to 300 °C).

Konstantin O. Petrosyants, Igor A. Kharitonov, Sergey V. Lebedev, Lev M. Sambursky, Sergey O. Safonov, Veniamin G. Stakhin

Microelectron. Reliab., 2017

Radiation-Induced Fault Simulation of SOI/SOS CMOS LSI's Using Universal Rad-SPICE MOSFET Model.

Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Boris G. Lvov

J. Electron. Test., 2017

Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications.

Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Mamed R. Ismail-Zade

Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

Electro-thermo-rad SPICE models for SOI/SOS MOSFETs.

Igor A. Kharitonov

Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

2016

Fault simulation in radiation-hardened SOI CMOS VLSIs using universal compact MOSFET model.

Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Boris G. Lvov

Proceedings of the 17th Latin-American Test Symposium, 2016

2014

The system of microelectronics education for aerospace industry based on "university-enterprise" link.

A. N. Tikhonov, Boris G. Lvov, Konstantin O. Petrosyants, Saygid U. Uvaysov, Igor A. Kharitonov, S. V. Balakin, A. N. Chetyrkin, V. N. Krutikov

Proceedings of the 10th European Workshop on Microelectronics Education (EWME), 2014

Analysis and Simulation of temperature-current rise in modern PCB traces.

Konstantin O. Petrosyants, Artur Kortunov, Igor A. Kharitonov, Anton Popov, Natalya Gomanilova, Nikita I. Rjabov

Proceedings of the 2014 East-West Design & Test Symposium, 2014

2013

Simulation of total dose influence on analog-digital SOI/SOS CMOS circuits with EKV-RAD macromodel.

Konstantin O. Petrosyants, Igor A. Kharitonov, Lev M. Sambursky, V. N. Bogatyrev, Z. M. Povarnitcyna, E. S. Drozdenko

Proceedings of the East-West Design & Test Symposium, 2013

Coupled TCAD-SPICE simulation of parasitic BJT effect on SOI CMOS SRAM SEU.

Konstantin O. Petrosyants, Igor A. Kharitonov, D. A. Popov

Proceedings of the East-West Design & Test Symposium, 2013

New version of automated electro-thermal analysis in Mentor Graphics PCB Design System.

Konstantin O. Petrosyants, P. A. Kozynko, Igor A. Kharitonov, A. V. Sidorov, Y. N. Chichkanov

Proceedings of the East-West Design & Test Symposium, 2013

Account for Radiation Effects in Signal Integrity Analysis of PCB Digital Systems.

Konstantin O. Petrosyants, Igor A. Kharitonov

Proceedings of the 2013 Euromicro Conference on Digital System Design, 2013

2011

TCAD-SPICE simulation of MOSFET switch delay time for different CMOS technologies.

Konstantin O. Petrosyants, E. V. Orekhov, D. A. Popov, Igor A. Kharitonov, Lev M. Sambursky, A. P. Yatmanov, A. V. Voevodin, A. N. Mansurov

Proceedings of the 9th East-West Design & Test Symposium, 2011

2002

Multi-Level Testing Strategy for Radiation Hardened SOI/SOS ICs.

Konstantin O. Petrosjanc, Igor A. Kharitonov, Alexej S. Adonin

Proceedings of the 3rd Latin American Test Workshop, 2002

1995

Software system for semiconductor devices, monolith and hybrid ICs thermal analysis.

Konstantin O. Petrosjanc, Igor A. Kharitonov, N. I. Rybov, Peter P. Maltcev

Proceedings of the Proceedings EURO-DAC'95, 1995