Ibtissem Seghaier

According to our database, Ibtissem Seghaier authored at least 9 papers between 2013 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2020

Mating Sensitivity Analysis and Statistical Verification for Efficient Yield Estimation.

Ibtissem Seghaier, Mohamed H. Zaki, Sofiène Tahar

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

2018

Reliability Analysis of CMOS Rambus Oscillator under Device Mismatch Effects.

Ibtissem Seghaier, Sofiène Tahar

Proceedings of the 16th IEEE International New Circuits and Systems Conference, 2018

Discriminating Chaos from Non-Gaussian Noise on Analog Circuits.

Ibtissem Seghaier, Sofiène Tahar

Proceedings of the 16th IEEE International New Circuits and Systems Conference, 2018

2017

Intertwined Global Optimization Based Reachability Analysis.

Ibtissem Seghaier, Sofiène Tahar

Proceedings of the Verification and Evaluation of Computer and Communication Systems, 2017

2016

Cross recurrence verification technique for process variation-resilient analog circuits.

Ibtissem Seghaier, Mohamed H. Zaki, Sofiène Tahar

Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

2015

A Statistical Approach to Probe Chaos from Noise in Analog and Mixed Signal Designs.

Ibtissem Seghaier, Mohamed H. Zaki, Sofiène Tahar

Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015

Statistically Validating the Impact of Process Variations on Analog and Mixed Signal Designs.

Ibtissem Seghaier, Mohamed H. Zaki, Sofiène Tahar

Proceedings of the 25th edition on Great Lakes Symposium on VLSI, GLVLSI 2015, Pittsburgh, PA, USA, May 20, 2015

2014

A qualitative simulation approach for verifying PLL locking property.

Ibtissem Seghaier, Henda Aridhi, Mohamed H. Zaki, Sofiène Tahar

Proceedings of the Great Lakes Symposium on VLSI 2014, GLSVLSI '14, Houston, TX, USA - May 21, 2014

2013

Statistical Run-Time Verification of Analog Circuits in Presence of Noise and Process Variation.

Rajeev Narayanan, Ibtissem Seghaier, Mohamed H. Zaki, Sofiène Tahar

IEEE Trans. Very Large Scale Integr. Syst., 2013