Iboun Taimiya Sylla

According to our database, Iboun Taimiya Sylla authored at least 6 papers between 1998 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2006

A new low-cost RF built-in self-test measurement for system-on-chip transceivers.

Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla

IEEE Trans. Instrum. Meas., 2006

A Novel RF Test Scheme Based on a DFT Method.

Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla

J. Electron. Test., 2006

2004

A new BIST scheme for 5GHz low noise amplifiers.

Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla

Proceedings of the 9th European Test Symposium, 2004

2003

Building An RF Source For Low Cost Testers Using An ADPLL Controlled By Texas Instruments Digital Signal Processor (DSP) TMS320C5402.

Iboun Taimiya Sylla

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2001

A Unity Gain High Speed Buffer to Improve Signal Integrity in High Frequency Test Interface.

Iboun Taimiya Sylla, Mustapha Slamani, Bozena Kaminska

J. Electron. Test., 2001

1998

Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing.

Iboun Taimiya Sylla, Mustapha Slamani, Bozena Kaminska, Fartoumi M. Hossein, Patrick Vincent

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998