Ian Hill
Orcid: 0000-0001-9782-8522
According to our database1,
Ian Hill
authored at least 5 papers
between 2019 and 2024.
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Bibliography
2024
Enhanced Wear-Out Sensor Design in a 12nm Process for Separable Stress Regime Monitoring.
Proceedings of the 42nd IEEE VLSI Test Symposium, 2024
A Novel Induced Offset Voltage Sensor for Separable Wear-Out Mechanism Characterization in a 12nm FinFET Process.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2023
Gerabaldi: A Temporal Simulator for Probabilistic IC Degradation and Failure Processes.
Proceedings of the 41st IEEE VLSI Test Symposium, 2023
2022
Proceedings of the IEEE European Test Symposium, 2022
2019
Proceedings of the International Conference on Robotics and Automation, 2019