I. H. Joo

According to our database, I. H. Joo authored at least 1 paper in 2013.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2013

Hot hole-induced device degradation by drain junction reverse current.

K. S. Kim, H. J. Kim, P. H. Choi, H. S. Park, I. H. Joo, J. E. Song, D. H. Song, Byoung Deog Choi

Microelectron. Reliab., 2013