I. D. Dear

According to our database, I. D. Dear authored at least 6 papers between 1986 and 1994.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

1994

Test strategy planning using economic analysis.

I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick

J. Electron. Test., 1994

1993

Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards.

Chryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

Economics in Design and Test.

Chryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick

Proceedings of the Proceedings 1993 International Conference on Computer Design: VLSI in Computers & Processors, 1993

1991

Economic Effects in Design and Test.

I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick

IEEE Des. Test Comput., 1991

1989

Cost Analysis of Test Method Environments.

Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler

Proceedings of the Proceedings International Test Conference 1989, 1989

1986

Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI.

Mark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear

Proceedings of the Proceedings International Test Conference 1986, 1986