Hyunyul Lim

According to our database, Hyunyul Lim authored at least 14 papers between 2013 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2020

Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks.

Hyunyul Lim, Minho Cheong, Sungho Kang

Sensors, 2020

2019

A Hardware-efficient TSV Repair Scheme Based on Butterfly Topology.

Minho Cheng, Hyunyul Lim, Tae Hyun Kim, Sungho Kang

Proceedings of the 2019 International SoC Design Conference, 2019

2018

Neural Network Reliability Enhancement Approach Using Dropout Underutilization in GPU.

Dongsu Lee, Hyunyul Lim, Tae Hyun Kim, Sungho Kang

Proceedings of the TENCON 2018, 2018

2017

FRESH: A New Test Result Extraction Scheme for Fast TSV Tests.

Jaeseok Park, Hyunyul Lim, Sungho Kang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

LARECD: Low area overhead and reliable error correction DMR architecture.

Hyunyul Lim, Tae Hyun Kim, Dongsu Lee, Sungho Kang

Proceedings of the International SoC Design Conference, 2017

2016

Optimized Built-In Self-Repair for Multiple Memories.

Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang

IEEE Trans. Very Large Scale Integr. Syst., 2016

A New 3-D Fuse Architecture to Improve Yield of 3-D Memories.

Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

P-backtracking: A new scan chain diagnosis method with probability.

Tae Hyun Kim, Hyunyul Lim, Sungho Kang

Proceedings of the International SoC Design Conference, 2016

2015

A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories.

Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang

IEEE Trans. Reliab., 2015

3-D Stacked DRAM Refresh Management With Guaranteed Data Reliability.

Jaeil Lim, Hyunyul Lim, Sungho Kang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability.

Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang

ACM Comput. Surv., 2015

Low power scan bypass technique with test data reduction.

Hyunyul Lim, Wooheon Kang, Sungyoul Seo, Yong Lee, Sungho Kang

Proceedings of the Sixteenth International Symposium on Quality Electronic Design, 2015

2013

Dynamic thermal management for 3D multicore processors under process variations.

Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang

IEICE Electron. Express, 2013

Thermal-aware dynamic voltage frequency scaling for many-core processors under process variations.

Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang

IEICE Electron. Express, 2013