Hyungjun Jo
Orcid: 0000-0002-8288-019X
According to our database1,
Hyungjun Jo
authored at least 2 papers
between 2022 and 2023.
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Bibliography
2023
A Novel Read Scheme Using GIDL Current to Suppress Read Disturbance in 3-D nand Flash Memories.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., December, 2023
2022
Investigation of endurance degradation for 3-D charge trap NAND flash memory with bandgap-engineered tunneling oxide.
IEICE Electron. Express, 2022