Hyun Woo Choi
According to our database1,
Hyun Woo Choi
authored at least 29 papers
between 2007 and 2019.
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Bibliography
2019
Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal Acquisition.
J. Electron. Test., 2019
2016
Concurrent Multi-Channel Crosstalk Jitter Characterization Using Coprime Period Channel Stimulus.
IEEE Trans. Circuits Syst. I Regul. Pap., 2016
2015
Wideband Sparse Signal Acquisition With Dual-rate Time-Interleaved Undersampling Hardware and Multicoset Signal Reconstruction Algorithms.
IEEE Trans. Signal Process., 2015
Low Cost Sparse Multiband Signal Characterization Using Asynchronous Multi-Rate Sampling: Algorithms and Hardware.
J. Electron. Test., 2015
Proceedings of the 20th IEEE European Test Symposium, 2015
2014
Timing Noise Characterization of High-Speed Digital Bit Sequences Using Incoherent Subsampling and Algorithmic Clock Recovery.
IEEE Trans. Instrum. Meas., 2014
Multi-channel testing architecture for high-speed eye-diagram using pin electronics and subsampling monobit reconstruction algorithms.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014
2013
Low-Resolution DAC-Driven Linearity Testing of Higher Resolution ADCs Using Polynomial Fitting Measurements.
IEEE Trans. Very Large Scale Integr. Syst., 2013
Low-cost multi-channel testing of periodic signals using monobit receivers and incoherent subsampling.
Proceedings of the 31st IEEE VLSI Test Symposium, 2013
Enhanced Resolution Time-Domain Reflectometry for High Speed Channels: Characterizing Spatial Discontinuities with Non-ideal Stimulus.
Proceedings of the 22nd Asian Test Symposium, 2013
2012
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012
J. Electron. Test., 2012
Dual-frequency incoherent subsampling driven test response acquisition of spectrally sparse wideband signals with enhanced time resolution.
Proceedings of the 30th IEEE VLSI Test Symposium, 2012
Low-cost high-speed pseudo-random bit sequence characterization using nonuniform periodic sampling in the presence of noise.
Proceedings of the 30th IEEE VLSI Test Symposium, 2012
Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters.
Proceedings of the 2012 IEEE International Test Conference, 2012
Low-cost wideband periodic signal reconstruction using incoherent undersampling and back-end cost optimization.
Proceedings of the 2012 IEEE International Test Conference, 2012
Low cost high-speed test data acquisition: Accurate period estimation driven signal reconstruction using incoherent subsampling.
Proceedings of the 2012 IEEE International Test Conference, 2012
Proceedings of the 2012 IEEE International Test Conference, 2012
Spectral Estimation Based Acquisition of Incoherently Under-sampled Periodic Signals: Application to Bandwidth Interleaving.
Proceedings of the 21st IEEE Asian Test Symposium, 2012
2011
Signal Acquisition of High-Speed Periodic Signals Using Incoherent Sub-Sampling and Back-End Signal Reconstruction Algorithms.
IEEE Trans. Very Large Scale Integr. Syst., 2011
2010
Jitter measurement of high-speed digital signals using low-cost signal acquisition hardware and associated algorithms.
PhD thesis, 2010
Digitally Assisted Concurrent Built-In Tuning of RF Systems Using Hamming Distance Proportional Signatures.
Proceedings of the 19th IEEE Asian Test Symposium, 2010
Jitter Characterization of Pseudo-random Bit Sequences Using Incoherent Sub-sampling.
Proceedings of the 19th IEEE Asian Test Symposium, 2010
2009
Proceedings of the 27th International Conference on Computer Design, 2009
Proceedings of the Eighteentgh Asian Test Symposium, 2009
2008
EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms.
Proceedings of the 2008 IEEE International Test Conference, 2008
Built-in Test of Frequency Modulated RF Transmitters Using Embedded Low-Pass Filters.
Proceedings of the 13th European Test Symposium, 2008
Proceedings of the Design, Automation and Test in Europe, 2008
2007
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007