Hyun Jun Jang
According to our database1,
Hyun Jun Jang
authored at least 5 papers
between 2007 and 2016.
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Bibliography
2016
Impact of work function of the silicon bottom-gates on electrical instability in InGaZnO thin film transistors.
Microelectron. Reliab., 2016
2013
Impact of back gate biases on hot carrier effects in multiple gate junctionless transistors.
Microelectron. Reliab., 2013
A comparative study on device degradation under a positive gate stress and hot carrier stress in InGaZnO thin film transistors.
Microelectron. Reliab., 2013
2008
Proceedings of the Intelligence and Security Informatics, 2008
2007
Proceedings of the Intelligence and Security Informatics, Pacific Asia Workshop, 2007