Hyeong Joon Kim

According to our database, Hyeong Joon Kim authored at least 1 paper in 2003.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2003

Electrical reliability of highly reliable 256M-bit mobile DRAM with top-edge round STI and dual gate oxide.

Chihoon Lee, Donggun Park, Hyeong Joon Kim, Wonshik Lee

Microelectron. Reliab., 2003