Hussein Bazzi
Orcid: 0000-0003-3901-1746
According to our database1,
Hussein Bazzi
authored at least 9 papers
between 2017 and 2022.
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Bibliography
2022
STATE: A Test Structure for Rapid Prediction of Resistive RAM Electrical Parameter Variability.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022
2021
Performances and Stability Analysis of a Novel 8T1R Non-Volatile SRAM (NVSRAM) versus Variability.
J. Electron. Test., 2021
2020
Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020
Resistive RAM SET and RESET Switching Voltage Evaluation as an Entropy Source for Random Number Generation.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020
2019
True random number generation exploiting SET voltage variability in resistive RAM memory arrays.
Proceedings of the 19th Non-Volatile Memory Technology Symposium, 2019
Proceedings of the 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2019
2018
Proceedings of the 30th International Conference on Microelectronics, 2018
Proceedings of the 2018 International Conference on Computer and Applications (ICCA), 2018
2017
Proceedings of the 29th International Conference on Microelectronics, 2017