Hussain Al-Asaad
According to our database1,
Hussain Al-Asaad
authored at least 32 papers
between 1993 and 2024.
Collaborative distances:
Collaborative distances:
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2024
On the Performance of Malware Detection Classifiers Using Hardware Performance Counters.
Proceedings of the International Conference on Smart Applications, 2024
Advancements in Secure Computing: Exploring Automated Repair Debugging and Verification Techniques for Hardware Design.
Proceedings of the 14th IEEE Annual Computing and Communication Workshop and Conference, 2024
2022
Proceedings of the 12th IEEE Annual Computing and Communication Workshop and Conference, 2022
2010
Efficient techniques for reducing error latency in on-line periodic built-in self-test.
IEEE Instrum. Meas. Mag., 2010
A Comparison of NMOS to PMOS Starved Buffer Implementations for the Delay Line in a PWM DC-DC Converters.
Proceedings of the 2010 International Conference on Computer Design, 2010
Time-Redundant Logic-Level Protection Mechanisms from Soft Errors in Digital Systems.
Proceedings of the 2010 International Conference on Computer Design, 2010
2009
Low Power Methodologies and Challenges for PWM DC-DC Converters.
Proceedings of the 2009 International Conference on Computer Design, 2009
Detection and Isolation of Faulty Processors in Multiprocessor Systems via TMR-Based Time Redundant Task Scheduling.
Proceedings of the 2009 International Conference on Computer Design, 2009
2008
IEEE Trans. Very Large Scale Integr. Syst., 2008
2007
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2007), 2007
Efficient Global Fault Collapsing for Combinational Library Modules.
Proceedings of the 2007 International Conference on Computer Design, 2007
2006
Proceedings of the Seventh International Workshop on Microprocessor Test and Verification (MTV 2006), 2006
Survey and Evaluation of Low-Power Flip-Flops.
Proceedings of the 2006 International Conference on Computer Design & Conference on Computing in Nanotechnology, 2006
2005
Proceedings of the Sixth International Workshop on Microprocessor Test and Verification (MTV 2005), 2005
EGFC: An exact global fault collapsing tool for combinational circuits.
Proceedings of the Third IASTED International Conference on Circuits, 2005
Proceedings of the Tenth IEEE International High-Level Design Validation and Test Workshop 2005, Napa Valley, CA, USA, November 30, 2005
On Increasing the Observability of Modern Microprocessors.
Proceedings of the 2005 International Conference on Computer Design, 2005
A Novel Functional Testing and Verification Technique for Logic Circuits.
Proceedings of the 2005 International Conference on Computer Design, 2005
2004
Proceedings of the Ninth IEEE International High-Level Design Validation and Test Workshop 2004, 2004
Survey and Evaluation of Low-Power Full-Adder Cells.
Proceedings of the International Conference on Embedded Systems and Applications, 2004
Approaches for Monitoring Vectors on Microprocessor Buses.
Proceedings of the International Conference on Embedded Systems and Applications, 2004
2003
Fault Tolerance for Multiprocessor Systems Via Time Redundant Task Scheduling.
Proceedings of the International Conference on VLSI, 2003
2000
J. Electron. Test., 2000
Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000
1998
PhD thesis, 1998
ACM Trans. Design Autom. Electr. Syst., 1998
1995
Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design, 1995
1994
Distributed Reconfiguration of Fault Tolerant VLSI Mulipipeline Arrays with Constant Interstage Path Lengths.
Proceedings of the Proceedings 1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1994
1993
Concurrent error correction in iterative circuits by recomputing with partitioning and voting.
Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993
A Two-Phase Reconfiguration Strategy for Extracting Linear Arrays Out of Two-Dimensional Architectures.
Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, 1993