Hung-Jen Liao

According to our database1, Hung-Jen Liao authored at least 41 papers between 2000 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2024
A 3-nm FinFET 27.6-Mbit/mm<sup>2</sup> Single-Port 6T SRAM Enabling 0.48-1.2 V Wide Operating Range With Far-End Pre-Charge and Weak-Bit Tracking.
IEEE J. Solid State Circuits, April, 2024

A 3nm Fin-FET 19.87-Mbit/mm<sup>2</sup> 2RW Pseudo Dual-Port 6T SRAM with High-R Wire Tracking and Sequential Access Aware Dynamic Power Reduction.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

A 3.3GHz 1024X640 Multi-Bank Single-Port SRAM with Frequency Enhancing Techniques and 0.55V-1.35V Wide Voltage Range Operation in 3nm FinFET for HPC Applications.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

34.4 A 3nm, 32.5TOPS/W, 55.0TOPS/mm<sup>2</sup> and 3.78Mb/mm<sup>2</sup> Fully-Digital Compute-in-Memory Macro Supporting INT12 × INT12 with a Parallel-MAC Architecture and Foundry 6T-SRAM Bit Cell.
Proceedings of the IEEE International Solid-State Circuits Conference, 2024

2023
A 4.24GHz 128X256 SRAM Operating Double Pump Read Write Same Cycle in 5nm Technology.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

3.7-GHz Multi-Bank High-Current Single-Port Cache SRAM with 0.5V-1.4V Wide Voltage Range Operation in 3nm FinFET for HPC Applications.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

A 3nm 256Mb SRAM in FinFET Technology with New Array Banking Architecture and Write-Assist Circuitry Scheme for High-Density and Low-VMIN Applications.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

A 3-nm 27.6-Mbit/mm2 Self-timed SRAM Enabling 0.48 - 1.2 V Wide Operating Range with Far-end Pre-charge and Weak-Bit Tracking.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

A 4nm 6163-TOPS/W/b $\mathbf{4790-TOPS/mm^{2}/b}$ SRAM Based Digital-Computing-in-Memory Macro Supporting Bit-Width Flexibility and Simultaneous MAC and Weight Update.
Proceedings of the IEEE International Solid- State Circuits Conference, 2023

2022
A 135.6Tbps/W 2R2W SRAM with 12T Logic Bit-cell with Vmin Down to 335mV Targeted for Machine-Learning Applications in 6nm FinFET CMOS Technology.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022

A 5-nm 254-TOPS/W 221-TOPS/mm<sup>2</sup> Fully-Digital Computing-in-Memory Macro Supporting Wide-Range Dynamic-Voltage-Frequency Scaling and Simultaneous MAC and Write Operations.
Proceedings of the IEEE International Solid-State Circuits Conference, 2022

2021
A 7-nm Compute-in-Memory SRAM Macro Supporting Multi-Bit Input, Weight and Output and Achieving 351 TOPS/W and 372.4 GOPS.
IEEE J. Solid State Circuits, 2021

A 5-nm 135-Mb SRAM in EUV and High-Mobility Channel FinFET Technology With Metal Coupling and Charge-Sharing Write-Assist Circuitry Schemes for High-Density and Low-V<sub>MIN</sub> Applications.
IEEE J. Solid State Circuits, 2021

3D-printed mold-assisted U-shaped optical fiber sensor for displacement sensing.
Proceedings of the 30th Wireless and Optical Communications Conference, 2021

A 5nm 5.7GHz@1.0V and 1.3GHz@0.5V 4kb Standard-Cell- Based Two-Port Register File with a 16T Bitcell with No Half-Selection Issue.
Proceedings of the IEEE International Solid-State Circuits Conference, 2021

An 89TOPS/W and 16.3TOPS/mm<sup>2</sup> All-Digital SRAM-Based Full-Precision Compute-In Memory Macro in 22nm for Machine-Learning Edge Applications.
Proceedings of the IEEE International Solid-State Circuits Conference, 2021

2020
15.1 A 5nm 135Mb SRAM in EUV and High-Mobility-Channel FinFET Technology with Metal Coupling and Charge-Sharing Write-Assist Circuitry Schemes for High-Density and Low-VMIN Applications.
Proceedings of the 2020 IEEE International Solid- State Circuits Conference, 2020

15.3 A 351TOPS/W and 372.4GOPS Compute-in-Memory SRAM Macro in 7nm FinFET CMOS for Machine-Learning Applications.
Proceedings of the 2020 IEEE International Solid- State Circuits Conference, 2020

2019
A 290-mV, 7-nm Ultra-Low-Voltage One-Port SRAM Compiler Design Using a 12T Write Contention and Read Upset Free Bit-Cell.
IEEE J. Solid State Circuits, 2019

A 7nm 2.1GHz Dual-Port SRAM with WL-RC Optimization and Dummy-Read-Recovery Circuitry to Mitigate Read- Disturb-Write Issue.
Proceedings of the IEEE International Solid- State Circuits Conference, 2019

2018
A 290MV Ultra-Low Voltage One-Port SRAM Compiler Design Using a 12T Write Contention and Read Upset Free Bit-Cell in 7NM FinFET Technology.
Proceedings of the 2018 IEEE Symposium on VLSI Circuits, 2018

2017
12.3 A low-power and high-performance 10nm SRAM architecture for mobile applications.
Proceedings of the 2017 IEEE International Solid-State Circuits Conference, 2017

12.1 A 7nm 256Mb SRAM in high-k metal-gate FinFET technology with write-assist circuitry for low-VMIN applications.
Proceedings of the 2017 IEEE International Solid-State Circuits Conference, 2017

2016
An efficient tabu search for cell planning problem in mobile communication.
Wirel. Commun. Mob. Comput., 2016

A 16nm dual-port SRAM with partial suppressed word-line, dummy read recovery and negative bit-line circuitries for low VMIN applications.
Proceedings of the 2016 IEEE Symposium on VLSI Circuits, 2016

A 64-Kb 0.37V 28nm 10T-SRAM with mixed-Vth read-port and boosted WL scheme for IoT applications.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2016

2015
A 16 nm 128 Mb SRAM in High-κ Metal-Gate FinFET Technology With Write-Assist Circuitry for Low-VMIN Applications.
IEEE J. Solid State Circuits, 2015

17.2 A 64kb 16nm asynchronous disturb current free 2-port SRAM with PMOS pass-gates for FinFET technologies.
Proceedings of the 2015 IEEE International Solid-State Circuits Conference, 2015

2014
The importance of DFX, a foundry perspective.
Proceedings of the 2014 International Test Conference, 2014

13.5 A 16nm 128Mb SRAM in high-κ metal-gate FinFET technology with write-assist circuitry for low-VMIN applications.
Proceedings of the 2014 IEEE International Conference on Solid-State Circuits Conference, 2014

A configurable 2-in-1 SRAM compiler with constant-negative-level write driver for low Vmin in 16nm Fin-FET CMOS.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2014

2013
An Offset-Tolerant Fast-Random-Read Current-Sampling-Based Sense Amplifier for Small-Cell-Current Nonvolatile Memory.
IEEE J. Solid State Circuits, 2013

Intrusion detection system: A comprehensive review.
J. Netw. Comput. Appl., 2013

A 20nm 112Mb SRAM in High-к metal-gate with assist circuitry for low-leakage and low-VMIN applications.
Proceedings of the 2013 IEEE International Solid-State Circuits Conference, 2013

2012
Compact Measurement Schemes for Bit-Line Swing, Sense Amplifier Offset Voltage, and Word-Line Pulse Width to Characterize Sensing Tolerance Margin in a 40 nm Fully Functional Embedded SRAM.
IEEE J. Solid State Circuits, 2012

2011
A Large Sigma V <sub>TH</sub> /VDD Tolerant Zigzag 8T SRAM With Area-Efficient Decoupled Differential Sensing and Fast Write-Back Scheme.
IEEE J. Solid State Circuits, 2011

An offset-tolerant current-sampling-based sense amplifier for Sub-100nA-cell-current nonvolatile memory.
Proceedings of the IEEE International Solid-State Circuits Conference, 2011

2010
A Differential Data-Aware Power-Supplied (D <sup>2</sup> AP) 8T SRAM Cell With Expanded Write/Read Stabilities for Lower VDDmin Applications.
IEEE J. Solid State Circuits, 2010

2009
A 0.6 V Dual-Rail Compiler SRAM Design on 45 nm CMOS Technology With Adaptive SRAM Power for Lower VDD_min VLSIs.
IEEE J. Solid State Circuits, 2009

2007
A 45nm dual-port SRAM with write and read capability enhancement at low voltage.
Proceedings of the 2007 IEEE International SOC Conference, 2007

2000
etection of SRAM cell stability by lowering array supply voltage.
Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000


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