Hung-Chi Han

According to our database, Hung-Chi Han authored at least 9 papers between 2021 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

A Comprehensive Output Conductance Model Valid in All Regions of Inversion.

Christian C. Enz, Hung-Chi Han, Corentin Délignac, Thierry Taris

Proceedings of the IEEE International Symposium on Circuits and Systems, 2024

2023

Novel Approach to FDSOI Threshold Voltage Model Validated at Cryogenic Temperatures.

Hung-Chi Han, Zhixing Zhao, Steffen Lehmann, Edoardo Charbon, Christian C. Enz

IEEE Access, 2023

Design of Low-power Analog Circuits in Advanced Technology Nodes using the $G_{m}/I_{D}$ Approach.

Christian C. Enz, Hung-Chi Han, Simon Berner

Proceedings of the IEEE International Symposium on Circuits and Systems, 2023

The Fano Noise Suppression Factor and the $G_{m}/I_{D}$ FoM.

Christian C. Enz, Hung-Chi Han

Proceedings of the IEEE International Symposium on Circuits and Systems, 2023

Design of Cryo-CMOS Analog Circuits using the $G_{m}/I_{D}$ Approach.

Christian C. Enz, Hung-Chi Han

Proceedings of the IEEE International Symposium on Circuits and Systems, 2023

2022

SEKV-E: Parameter Extractor of Simplified EKV I-V Model for Low-Power Analog Circuits.

Hung-Chi Han, Antonio A. D'Amico, Christian C. Enz

IEEE Open J. Circuits Syst., 2022

Comprehensive Design-oriented FDSOI EKV Model.

Hung-Chi Han, Antonio A. D'Amico, Christian C. Enz

Proceedings of the 29th International Conference on Mixed Design of Integrated Circuits and System, 2022

Cryogenic RF Characterization and Simple Modeling of a 22 nm FDSOI Technology.

Hung-Chi Han, Farzan Jazaeri, Antonio A. D'Amico, Zhixing Zhao, Steffen Lehmann, Claudia Kretzschmar, Edoardo Charbon, Christian C. Enz

Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

2021

Cryogenic Characterization of 16 nm FinFET Technology for Quantum Computing.

Hung-Chi Han, Farzan Jazaeri, Antonio A. D'Amico, Andrea Baschirotto, Edoardo Charbon, Christian C. Enz

Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021