Huimei Zhou
According to our database1,
Huimei Zhou
authored at least 11 papers
between 2019 and 2024.
Collaborative distances:
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2024
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On csauthors.net:
Bibliography
2024
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024
Proceedings of the IEEE International Reliability Physics Symposium, 2024
A New Clustering-Function-Based Formulation of Temporal and Spatial Clustering Model Involving Area Scaling and its Application to Parameter Extraction.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2023
Impact of Gate Stack Thermal Budget on NBTI Reliability in Gate-All-Around Nanosheet P-type Devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2021
Proceedings of the IEEE International Reliability Physics Symposium, 2021
Proceedings of the IEEE International Reliability Physics Symposium, 2021
2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Analysis of BTI, SHE Induced BTI and HCD Under Full VG/VD Space in GAA Nano-Sheet N and P FETs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2019
Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor.
Proceedings of the IEEE International Reliability Physics Symposium, 2019