Hui-Wen Tsai

According to our database, Hui-Wen Tsai authored at least 5 papers between 2007 and 2015.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2015

Compensation circuit with additional junction sensor to enhance latchup immunity for CMOS integrated circuits.

Hui-Wen Tsai, Ming-Dou Ker

Proceedings of the European Conference on Circuit Theory and Design, 2015

2013

Analysis and solution to overcome EOS failure induced by latchup test in a high-voltage integrated circuits.

Hui-Wen Tsai, Ming-Dou Ker, Yi-Sheng Liu, Ming-Nan Chuang

Proceedings of the 2013 International Symposium on VLSI Design, Automation, and Test, 2013

2011

Design to suppress return-back leakage current of charge pump circuit in low-voltage CMOS process.

Yi-Hsin Weng, Hui-Wen Tsai, Ming-Dou Ker

Microelectron. Reliab., 2011

2010

Design of 2xVDD-tolerant mixed-voltage I/O buffer against gate-oxide reliability and hot-carrier degradation.

Hui-Wen Tsai, Ming-Dou Ker

Microelectron. Reliab., 2010

2007

Design of 2�?VDD-Tolerant I/O Buffer with Considerations of Gate-Oxide Reliability and Hot-Carrier Degradation.

Hui-Wen Tsai, Ming-Dou Ker

Proceedings of the 14th IEEE International Conference on Electronics, 2007