Hugh J. Barnaby
Orcid: 0000-0002-8136-1849Affiliations:
- Arizona State University, Tempe, AZ, USA
- Vanderbilt University, Nashville, TN, USA (PhD 2001)
According to our database1,
Hugh J. Barnaby
authored at least 20 papers
between 2005 and 2024.
Collaborative distances:
Collaborative distances:
Awards
IEEE Fellow
IEEE Fellow 2017, "For research of radiation effects in bipolar junction transistors".
Timeline
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Book In proceedings Article PhD thesis Dataset OtherLinks
Online presence:
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on orcid.org
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Bibliography
2024
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2023
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Effect of conductance linearity of Ag-chalcogenide CBRAM synaptic devices on the pattern recognition accuracy of an analog neural training accelerator.
Neuromorph. Comput. Eng., 2022
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022
2021
Neuromorph. Comput. Eng., 2021
2019
Monolithically Integrated RRAM- and CMOS-Based In-Memory Computing Optimizations for Efficient Deep Learning.
IEEE Micro, 2019
Evaluation of Single Event Effects in SRAM and RRAM Based Neuromorphic Computing System for Inference.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2017
Proceedings of the 2017 IEEE International Symposium on Hardware Oriented Security and Trust, 2017
2016
Demonstration of spike timing dependent plasticity in CBRAM devices with silicon neurons.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016
2015
IEEE J. Emerg. Sel. Topics Circuits Syst., 2015
2014
Transient response exploration of SRAM cell metastable states caused by ionizing radiation with 3D mixed mode simulation.
Proceedings of the 21st IEEE International Conference on Electronics, Circuits and Systems, 2014
2011
Microelectron. Reliab., 2011
2010
Proceedings of the 5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, 2010
2009
IEEE Trans. Circuits Syst. I Regul. Pap., 2009
A 14mW 5Gb/s CMOS TIA with gain-reuse regulated cascode compensation for parallel optical interconnects.
Proceedings of the IEEE International Solid-State Circuits Conference, 2009
2008
Microelectron. Reliab., 2008
Proceedings of the 2008 IEEE International Solid-State Circuits Conference, 2008
A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision.
Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, 2008
2005