Huei Hao Yap

According to our database, Huei Hao Yap authored at least 4 papers between 2015 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2016

Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system.

Yuzhe Zhao, Q. J. Wang, Pik Kee Tan, Huei Hao Yap, Binghai Liu, H. Feng, Hao Tan, Ran He, Y. M. Huang, D. D. Wang, Lei Zhu, C. Q. Chen, Francis Rivai, Jeffrey Lam, Zhihong Mai

Microelectron. Reliab., 2016

Application of laser deprocessing technique in PFA on chemical over-etched on bond-pad issue.

Huei Hao Yap, Pik Kee Tan, Lei Zhu, H. Feng, Yuzhe Zhao, Ran He, Hao Tan, B. Liu, Y. M. Huang, D. D. Wang, Jeffrey Lam, Zhihong Mai

Microelectron. Reliab., 2016

Cross-sectional nanoprobing fault isolation technique on submicron devices.

Pik Kee Tan, Huei Hao Yap, Changqing Chen, Francis Rivai, Yuzhe Zhao, Lei Zhu, Hua Feng, Hao Tan, Ran He, D. D. Wang, Y. M. Huang, Yin Zhe Ma, Jeffrey Lam, Zhi Hong Mai

Microelectron. Reliab., 2016

2015

Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique.

Huei Hao Yap, Pik Kee Tan, G. R. Low, M. K. Dawood, Hua Feng, Yuzhe Zhao, Ran He, Hao Tan, J. Zhu, Binghai Liu, Y. M. Huang, D. D. Wang, Jeffrey Lam, Zhihong Mai

Microelectron. Reliab., 2015