Hubert Enichlmair

According to our database¹, Hubert Enichlmair authored at least 7 papers between 2007 and 2015.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

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PhD thesis

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Bibliography

2015

Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2015

2011

An analytical approach for physical modeling of hot-carrier induced degradation.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2011

2010

Interface traps density-of-states as a vital component for hot-carrier degradation modeling.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2010

2008

Hot-carrier reliability in high-voltage lateral double-diffused MOS transistors.

[BibT_eX]

[DOI]

IET Circuits Devices Syst., 2008

Scalable High Voltage CMOS technology for Smart Power and sensor applications.

[BibT_eX]

[DOI]

Friedrich Peter Leisenberger

Ewald Wachmann

Gregor Schatzberger

Heimo Gensinger

Elektrotech. Informationstechnik, 2008

2007

Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2007

Analysis of hot carrier effects in a 0.35 µm high voltage n-channel LDMOS transistor.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2007

Hubert Enichlmair

Timeline

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