Huali Duan
Orcid: 0000-0001-8610-1897Timeline
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Bibliography
2024
Artificial neural network models for metal-ferroelectric-insulator-semiconductor ferroelectric tunnel junction memristor.
Microelectron. J., February, 2024
Multiphysics simulation study of thermal stress effects in nanoscale FinFETs heterogeneously integrated with GaN high-power device on silicon substrate.
Microelectron. J., 2024