Hsin-Wen Ting
Orcid: 0000-0002-0273-8194
According to our database1,
Hsin-Wen Ting
authored at least 22 papers
between 2004 and 2018.
Collaborative distances:
Collaborative distances:
Timeline
2004
2006
2008
2010
2012
2014
2016
2018
0
1
2
3
4
5
6
7
2
1
2
1
1
3
5
1
1
1
1
2
1
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2018
IEEE Trans. Instrum. Meas., 2018
A Fast and Jitter-Modulation Free Jitter Tolerance Estimation Technique for Bang- Bang CDRs.
IEEE Des. Test, 2018
2017
Analyses of Splittable Amplifier Technique and Cancellation of Memory Effect for Opamp Sharing.
IEEE Trans. Very Large Scale Integr. Syst., 2017
Multi-channel multi-gigabit PRBS generator with a built-in clock in 0.18-μm CMOS technology.
Proceedings of the International SoC Design Conference, 2017
2016
IEEE Trans. Instrum. Meas., 2016
IEEE Trans. Instrum. Meas., 2016
2015
A capacitance-ratio quantification design for linearity test in differential top-plate sampling sar ADCS.
Int. J. Circuit Theory Appl., 2015
2014
IEICE Trans. Electron., 2014
2012
Six-bit 2.7-GS/s 5.4-mW Nyquist complementary metal-oxide semiconductor digital-to-analogue converter for ultra-wideband transceivers.
IET Circuits Devices Syst., 2012
A Third-Order Low-Distortion Delta-Sigma Modulator with Opamp Sharing and Relaxed Feedback Path Timing.
IEICE Trans. Electron., 2012
J. Electron. Test., 2012
2011
Transition-Code Based Linearity Test Method for Pipelined ADCs With Digital Error Correction.
IEEE Trans. Very Large Scale Integr. Syst., 2011
Realization of High Octave Decomposition for Breast Cancer Feature Extraction on Ultrasound Images.
IEEE Trans. Circuits Syst. I Regul. Pap., 2011
J. Electron. Test., 2011
J. Electron. Test., 2011
J. Electron. Test., 2011
Proceedings of the IEEE 24th International SoC Conference, SOCC 2011, Taipei, Taiwan, 2011
2008
IEEE Trans. Instrum. Meas., 2008
2007
J. Electron. Test., 2007
2006
Proceedings of the 15th Asian Test Symposium, 2006
Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems 2006, 2006
2004
A Time Domain Built-In Self-Test Methodology for SNDR and ENOB Tests of Analog-to-Digital Converters.
Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004