Houng-Chi Wei

According to our database, Houng-Chi Wei authored at least 2 papers in 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2006

Comparison of Electrical and Reliability Characteristics of Different Tunnel Oxides in SONOS Flash Memory.

Jia-Lin Wu, Hua-Ching Chien, Chien-Wei Liao, Cheng-Yen Wu, Chih-Yuan Lee, Houng-Chi Wei, Shih-Hsien Chen, Hann-Ping Hwang, Saysamone Pittikoun, Travis Cho, Chin-Hsing Kao

Proceedings of the 14th IEEE International Workshop on Memory Technology, 2006

Detailed Comparisons of Program, Erase and Data Retention Characteristics between P+- and N+-Poly SONOS NAND Flash Memory.

Victor Chao-Wei Kuo, Chih-Ming Chao, Chih-Kai Kang, Li-Wei Liu, Tzung-Bin Huang, Liang-Tai Kuo, Shi-Hsien Chen, Houng-Chi Wei, Hann-Ping Hwang, Saysamone Pittikoun

Proceedings of the 14th IEEE International Workshop on Memory Technology, 2006