Hoonjung Kim

According to our database, Hoonjung Kim authored at least 1 paper in 2008.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2008

A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method.

Junghyun Nam, Sunghoon Chun, Gibum Koo, Yanggi Kim, Byungsoo Moon, Jonghyoung Lim, Jaehoon Joo, Sangseok Kang, Hoonjung Kim, Kyeongseon Shin, Kisang Kang, Sungho Kang

Proceedings of the 2008 IEEE International Test Conference, 2008