Hongquan He
Orcid: 0009-0003-3997-9789
According to our database1,
Hongquan He
authored at least 2 papers
in 2024.
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Bibliography
2024
PaLM: Point Cloud and Large Pre-trained Model Catch Mixed-type Wafer Defect Pattern Recognition.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024
Proceedings of the 61st ACM/IEEE Design Automation Conference, 2024