Hong-Dar Lin

Orcid: 0000-0003-1875-8779

According to our database1, Hong-Dar Lin authored at least 24 papers between 2006 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2024
Utilizing Deep Learning for Defect Inspection in Hand Tool Assembly.
Sensors, June, 2024

2023
Optical Panel Inspection Using Explicit Band Gaussian Filtering Methods in Discrete Cosine Domain.
Sensors, February, 2023

Optical Imaging Deformation Inspection and Quality Level Determination of Multifocal Glasses.
Sensors, 2023

2022
Incorporating Visual Defect Identification and Determination of Occurrence Side in Touch Panel Quality Inspection.
IEEE Access, 2022

2018
Advanced Artificial Neural Networks.
Algorithms, 2018

2013
Corrigendum to 'A note on "Intra-supply chain system with multiple sales locations and quality assurance"' [Experts Systems with Applications 40 (11) (2013) 4730-4732].
Expert Syst. Appl., 2013

A note on "intra-supply chain system with multiple sales locations and quality assurance".
Expert Syst. Appl., 2013

An innovative blemish detection system for curved LED lenses.
Expert Syst. Appl., 2013

2012
Note on "replenishment run time problem with machine breakdown and failure in rework".
Expert Syst. Appl., 2012

2011
Flaw detection of domed surfaces in LED packages by machine vision system.
Expert Syst. Appl., 2011

Mathematical modeling for solving manufacturing run time problem with defective rate and random machine breakdown.
Comput. Ind. Eng., 2011

Computational Optimization of Manufacturing Batch Size and Shipment for an Integrated EPQ Model with Scrap.
Am. J. Comput. Math., 2011

2010
Automated Industrial Inspection of LED Chips Using Multivariate Factor Analysis.
Proceedings of the 2010 International Conference on Image Processing, 2010

2009
Automated process adjustments of chip cutting operations using neural network and statistical approaches.
Expert Syst. Appl., 2009

Automated defect inspection of light-emitting diode chips using neural network and statistical approaches.
Expert Syst. Appl., 2009

A hybrid approach based on Hotelling statistics for automated visual inspection of display blemishes in LCD panels.
Expert Syst. Appl., 2009

Automated Industrial Inspection of Light-emitting Diodes Using Computer Vision.
Proceedings of the 2009 International Conference on Image Processing, 2009

2008
Tiny surface defect inspection of electronic passive components using discrete cosine transform decomposition and cumulative sum techniques.
Image Vis. Comput., 2008

A note on optimal replenishment policy for imperfect quality EMQ model with rework and backlogging.
Comput. Math. Appl., 2008

2007
Automated visual inspection of ripple defects using wavelet characteristic based multivariate statistical approach.
Image Vis. Comput., 2007

A Wavelet-Based Neural Network Applied to Surface Defect Detection of LED Chips.
Proceedings of the Advances in Neural Networks, 2007

Computer-Aided Vision System for Surface Blemish Detection of LED Chips.
Proceedings of the Adaptive and Natural Computing Algorithms, 8th International Conference, 2007

2006
Computer-Aided Vision System for MURA-Type Defect Inspection in Liquid Crystal Displays.
Proceedings of the Advances in Image and Video Technology, First Pacific Rim Symposium, 2006

Automated Detection of Color Non-Uniformity Defects in TFT-LCD.
Proceedings of the International Joint Conference on Neural Networks, 2006


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