Holger Goebel
Orcid: 0000-0003-2397-8688Affiliations:
- Helmut Schmidt University, Hamburg
According to our database1,
Holger Goebel
authored at least 8 papers
between 1993 and 2016.
Collaborative distances:
Collaborative distances:
Timeline
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on orcid.org
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Bibliography
2016
Proceedings of the 2016 IEEE Global Engineering Education Conference, 2016
2015
Int. J. Adv. Corp. Learn., 2015
2013
Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films.
Microelectron. Reliab., 2013
Quasi-static capacitance-voltage characteristics of pentacene-based metal-oxide-semiconductor structures.
Microelectron. J., 2013
2010
Intermittent-contact capacitance spectroscopy - A new method for determining C(V) curves with sub-micron lateral resolution.
Microelectron. Reliab., 2010
2009
Displacement current sensor for contact and intermittent contact scanning capacitance microscopy.
Microelectron. Reliab., 2009
2008
Intermittent-contact scanning capacitance microscopy versus contact mode SCM applied to 2D dopant profiling.
Microelectron. Reliab., 2008
1993
PhD thesis, 1993