Hock Guan Ong
According to our database1,
Hock Guan Ong
authored at least 3 papers
between 2016 and 2017.
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Bibliography
2017
J. Hardw. Syst. Secur., 2017
2016
Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop.
Microelectron. Reliab., 2016
Comprehensive Laser Sensitivity Profiling and Data Register Bit-Flips for Cryptographic Fault Attacks in 65 Nm FPGA.
Proceedings of the Security, Privacy, and Applied Cryptography Engineering, 2016