Ho-Nyeon Lee

According to our database, Ho-Nyeon Lee authored at least 2 papers between 2012 and 2015.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2015

Analysis of the dependence of indium-gallium-zinc oxide thin-film transistor properties on the gate interface material using a two-stack gate-insulator structure.

Jae-Chul Park, Tae Kwang Park, Ho-Nyeon Lee

Displays, 2015

2012

Dry etch damage and recovery of gallium indium zinc oxide thin-film transistors with etch-back structures.

Jae-Chul Park, Ho-Nyeon Lee

Displays, 2012