Hitoshi Kunitake

According to our database, Hitoshi Kunitake authored at least 4 papers between 2023 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2024

Heterogeneous Oxide Semiconductor FETs Comprising Planar FET and Vertical Channel FETs Monolithically Stacked on Si CMOS, Enabling 1-Mbit 3D DRAM.

Hiraki Inoue, Takeya Hirose, Toshiki Mizuguchi, Yusuke Komura, Toshihiko Saito, Minato Ito, Kiyotaka Kimura, Tatsuya Onuki, Yoshinori Ando, Hiromi Sawai, Tsutomu Murakawa, Hitoshi Kunitake, Takanori Matsuzaki, Hajime Kimura, Makoto Ikeda, Shunpei Yamazaki

Proceedings of the IEEE International Memory Workshop, 2024

2023

1Mbit 1T1C 3D DRAM with Monolithically Stacked One Planar FET and Two Vertical FET Heterogeneous Oxide Semiconductor layers over Si CMOS.

Yuki Okamoto, Yusuke Komura, Toshiki Mizuguchi, Toshihiko Saito, Minato Ito, K. Kimura, Tatsuya Onuki, Yoshinori Ando, Hiromi Sawai, Tsutomu Murakawa, Hitoshi Kunitake, Takanori Matsuzaki, Hajime Kimura, M. Fujita, Makoto Ikeda, Shunpei Yamazaki

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

Two-Dimensionally Arranged Display Drivers Achieved by OS/Si Structure.

Yusuke Komura, Shoki Miyata, Yuki Okamoto, Yuki Tamatsukuri, Hiroki Inoue, Toshihiko Saito, Munehiro Kozuma, Hidetomo Kobayashi, Tatsuya Onuki, Yuichi Yanagisawa, Toshihiko Takeuchi, Yutaka Okazaki, Hitoshi Kunitake, Daiki Nakamura, Takaaki Nagata, Yasumasa Yamane, Makoto Ikeda, Shih-Ci Yen, Chuan-Hua Chang, Wen-Hsiang Hsieh, Hiroshi Yoshida, Min-Cheng Chen, Ming-Han Liao, Shou-Zen Chang, Shunpei Yamazaki

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

Soft- and Hard-Error Radiation Reliability of 228 KB $3\mathrm{T}+1\mathrm{C}$ Oxide Semiconductor Memory.

H. Takahashi, Y. Okamoto, Toshiki Hamada, Yusuke Komura, S. Watanabe, K. Tsuda, H. Sawai, Takanori Matsuzaki, Yoshinori Ando, Tatsuya Onuki, Hitoshi Kunitake, Shunpei Yamazaki, D. Kobayashi, A. Ikuta, Takahiro Makino, Takeshi Ohshima

Proceedings of the IEEE International Reliability Physics Symposium, 2023