Hisafumi Iwata

According to our database, Hisafumi Iwata authored at least 4 papers between 1988 and 2002.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2002

Repair Yield Simulation with Iterative Critical Area Analysis for Different Types of Failure.

Yuichi Hamamura, Kazunori Nemoto, Takaaki Kumazawa, Hisafumi Iwata, Kousuke Okuyama, Shiro Kamohara, Aritoshi Sugimoto

Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002

1998

Thin Film Magnetic Head Wafer Inspection Technique Using Geometrical Feature Based Image Comparison.

Atsushi Shimoda, Hisafumi Iwata, Yukihiro Shibata, Hidehiro Ikeda

Proceedings of IAPR Workshop on Machine Vision Applications, 1998

1990

Precise Visual Inspection of LSI Wafer Patterns by Local Perturbation Pattern Matching Algorithm.

Yukio Matsuyama, Hisafumi Iwata, Hitoshi Kubota, Yasuo Nakagawa

Syst. Comput. Jpn., 1990

1988

Precise Visual Inspection Algorithm for LSI Wafer Patterns Using Grayscale Image Comparison.

Yukio Matsuyama, Hisafumi Iwata, Hitoshi Kubota, Yasuo Nakagawa

Proceedings of IAPR Workshop on Computer Vision, 1988