Hiroshige Goto

According to our database, Hiroshige Goto authored at least 4 papers between 2011 and 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2014

7.1 A 1/4-inch 8Mpixel CMOS image sensor with 3D backside-illuminated 1.12μm pixel with front-side deep-trench isolation and vertical transfer gate.

JungChak Ahn, Kyungho Lee, Yitae Kim, Heegeun Jeong, Bumsuk Kim, Hongki Kim, Jongeun Park, Taesub Jung, Wonje Park, Taeheon Lee, Eunkyung Park, Sangjun Choi, Gyehun Choi, Haeyong Park, Yujung Choi, Seungwook Lee, Yunkyung Kim, Y. J. Jung, Donghyuk Park, Seungjoo Nah, Youngsun Oh, Mihye Kim, Yooseung Lee, Youngwoo Chung, Ihara Hisanori, Joon-Hyuk Im, Daniel-K J Lee, Byunghyun Yim, GiDoo Lee, Heesang Kown, Sungho Choi, Jeonsook Lee, Dongyoung Jang, Youngchan Kim, Tae Chan Kim, Hiroshige Goto, Chi-Young Choi, Duckhyung Lee, Gab-soo Han

Proceedings of the 2014 IEEE International Conference on Solid-State Circuits Conference, 2014

2013

A novel pixel design with hybrid type isolation scheme for low dark current in CMOS image sensor.

Sung Ho Choi, Yi Tae Kim, Min Seok Oh, Younghwan Park, Jeongjin Cho, Youngheup Jang, Hyungjun Han, Jongwon Choi, Howoo Park, Sangil Jung, Hoon Sang Oh, Jung Chak Ahn, Hiroshige Goto, Chi-Young Choi, Yonghan Roh

Proceedings of the Sensors, 2013

2012

Backside-illumination 14µm-pixel QVGA time-of-flight CMOS imager.

Min Seok Oh, Hae Kyung Kong, Han Soo Lee, Kyungil Kim, Kwanghyuk Bae, Soo Bang Kim, Sungkwan Kim, Moosup Lim, Jung Chak Ahn, Tae-Chan Kim, Hiroshige Goto, Seoung Hyun Kim, Dong-Ki Min, Yong Jei Lee

Proceedings of the 10th IEEE International NEWCAS Conference, 2012

2011

A 1/2.33-inch 14.6M 1.4μm-pixel backside-illuminated CMOS image sensor with floating diffusion boosting.

Sangjoo Lee, Kyungho Lee, Jongeun Park, Hyungjun Han, Younghwan Park, Taesub Jung, Youngheup Jang, Bumsuk Kim, Yitae Kim, Shay Hamami, Uzi Hizi, Mickey Bahar, Changrok Moon, JungChak Ahn, Duckhyung Lee, Hiroshige Goto, Yun-Tae Lee

Proceedings of the IEEE International Solid-State Circuits Conference, 2011