Hiromu Fujioka
According to our database1,
Hiromu Fujioka
authored at least 15 papers
between 1996 and 2007.
Collaborative distances:
Collaborative distances:
Awards
IEEE Fellow
IEEE Fellow 2004, "For contributions to electron beam testing of semiconductor devices and circuits.".
Timeline
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On csauthors.net:
Bibliography
2007
Estimation of electron probe profile from SEM image through wavelet multiresolution analysis for inline SEM inspection.
Image Vis. Comput., 2007
Computer-assisted lesion detection system for stomach screening using stomach shape and appearance models.
Proceedings of the Medical Imaging 2007: Computer-Aided Diagnosis, 2007
2006
Image deblurring by the combined use of a super-resolution technique and inverse filtering.
Proceedings of the Computational Imaging IV, San Jose, 2006
2003
Proceedings of the 11th IEEE International Workshop on Memory Technology, 2003
2002
Microelectron. Reliab., 2002
2001
2000
EB tester fault localization algorithm for combinational circuits by utilizing fault simulation and test pattern sequence for EB tester.
Syst. Comput. Jpn., 2000
1999
Proceedings of the 8th Asian Test Symposium (ATS '99), 1999
1998
Knowledge-based circuit recognition from standard-cell design CMOS VLSI optical microscope images.
Syst. Comput. Jpn., 1998
1997
Hierarchical VLSI Fault Tracing by Successive Circuit Extraction from CAD Layout Data in the CAD-Linked EB Test System.
J. Electron. Test., 1997
Automatic EB Fault Tracing System by Successive Circuit Extraction from VLSI CAD Layout Data.
Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997
Hierarchical fault tracing for VLSI sequential circuits from CAD layout data in the CAD-linked EB test system.
Proceedings of the ASP-DAC '97 Asia and South Pacific Design Automation Conference, 1997
1996
Effects of Multi-Product, Small-Sized Production of LSIs Packaged in Various Packages on the Final Test Process Efficiency and Cost.
Proceedings of the Proceedings IEEE International Test Conference 1996, 1996