Hideki Murakami

According to our database1, Hideki Murakami authored at least 12 papers between 2005 and 2019.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2019
Development of In-situ Monitoring System for Crop Growth Observation.
Proceedings of the 2nd International Symposium on Devices, Circuits and Systems, 2019

2013
Evaluation of Chemical Composition and Bonding Features of Pt/SiO<sub>x</sub>/Pt MIM Diodes and Its Impact on Resistance Switching Behavior.
IEICE Trans. Electron., 2013

Control of Interfacial Reaction of HfO<sub>2</sub>/Ge Structure by Insertion of Ta Oxide Layer.
IEICE Trans. Electron., 2013

2012
Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared by RF Sputtering.
IEICE Trans. Electron., 2012

2011
Impact of Annealing Ambience on Resistive Switching in Pt/TiO<sub>2</sub>/Pt Structure.
IEICE Trans. Electron., 2011

Characterization of Mg Diffusion into HfO<sub>2</sub>/SiO<sub>2</sub>/Si(100) Stacked Structures and Its Impact on Detect State Densities.
IEICE Trans. Electron., 2011

2010
Quantitative differences in intervertebral disc-matrix composition with age-related degeneration.
Medical Biol. Eng. Comput., 2010

2007
Evaluation of Dielectric Reliability of Ultrathin HfSiO<sub>x</sub>N<sub>y</sub> in Metal-Gate Capacitors.
IEICE Trans. Electron., 2007

2005
Charging and Discharging Characteristics of Stacked Floating Gates of Silicon Quantum Dots.
IEICE Trans. Electron., 2005

Electrical Characterization of Aluminum-Oxynitride Stacked Gate Dielectrics Prepared by a Layer-by-Layer Process of Chemical Vapor Deposition and Rapid Thermal Nitridation.
IEICE Trans. Electron., 2005

Characterization of Atom Diffusion in Polycrystalline Si/SiGe/Si Stacked Gate.
IEICE Trans. Electron., 2005

Characterization of Germanium Nanocrystallites Grown on SiO<sub>2</sub> by a Conductive AFM Probe Technique.
IEICE Trans. Electron., 2005


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