Hervé Jaouen
Orcid: 0000-0002-9534-0029
According to our database1,
Hervé Jaouen
authored at least 3 papers
between 2013 and 2014.
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Bibliography
2014
Numerical analysis of thermo-mechanical and mobility effects for 28 nm node and beyond: Comparison and design consequences over bumping technologies.
Microelectron. Reliab., 2014
The importance of the spacer region to explain short channels mobility collapse in 28nm Bulk and FDSOI technologies.
Proceedings of the 44th European Solid State Device Research Conference, 2014
2013
Strain engineering for bumping over IPs: Numerical investigations of thermo-mechanical stress induced mobility variations for CMOS 32 nm and beyond.
Microelectron. Reliab., 2013