Helena Maria Geirinhas Ramos

Orcid: 0000-0002-4931-7960

According to our database1, Helena Maria Geirinhas Ramos authored at least 41 papers between 1998 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2024
Eddy Current-Based Delamination Imaging in CFRP Using Erosion and Thresholding Approaches.
Sensors, September, 2024

Classification of Corrosion Severity in SPCC Steels Using Eddy Current Testing and Supervised Machine Learning Models.
Sensors, April, 2024

I&M Around the World: Highlighting IEEE Region 9.
IEEE Instrum. Meas. Mag., April, 2024

Comparative Study on Ultrasonic C-Scan Imaging of Composite Lap Joints Using Piezoelectric Transducer: Pulse-Echo and Pitch-Catch Configurations.
IEEE Trans. Instrum. Meas., 2024

2023
Baseline-Free Damage Imaging of Composite Lap Joint via Parallel Array of Piezoelectric Sensors.
Sensors, November, 2023

TC-01: Nondestructive Evaluation and Industrial Inspection (NDE&II).
IEEE Instrum. Meas. Mag., September, 2023

Theoretical Predictions of Perturbed Magnetic Flux Density Components Due to Narrow Flaws in ECT.
IEEE Trans. Instrum. Meas., 2023

Polar Coordinate for Damage Imaging of Adhesively Bonded Plates Using Ultrasonic Guided Waves and Laser Doppler Vibrometer Measurements.
IEEE Trans. Instrum. Meas., 2023

Pulse-Echo and Pitch-Catch: Ultrasonic C-Scan of Adhesively Bonded Single Lap-joints.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2023

2022
Locating and Imaging Fiber Breaks in CFRP Using Guided Wave Tomography and Eddy Current Testing.
Sensors, 2022

Guided Lamb wave tomography using angle beam transducers and inverse Radon transform for crack image reconstruction.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2022

2020
Defect Classification With SVM and Wideband Excitation in Multilayer Aluminum Plates.
IEEE Trans. Instrum. Meas., 2020

Machine Learning Photovoltaic String Analyzer.
Entropy, 2020

2019
Locating Defects in Anisotropic CFRP Plates Using ToF-Based Probability Matrix and Neural Networks.
IEEE Trans. Instrum. Meas., 2019

Locating and Imaging Impact Damage with an Integrated System of PZT and Eddy Current Probe.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2019

Monitoring the Crack Growth by Measurement of Diffracted Lamb Waves.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2019

2018
Comparison of Inspecting Non-Ferromagnetic and Ferromagnetic Metals Using Velocity Induced Eddy Current Probe.
Sensors, 2018

Eddy current testing of cracks using multi-frequency and noise excitation.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018

Localization of defects in woven-fabric type CFRP plate by time of flight of scattering guided wave.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018

2017
Inspection of Cracks in Aluminum Multilayer Structures Using Planar ECT Probe and Inversion Problem.
IEEE Trans. Instrum. Meas., 2017

The dilation invariance principle in eddy-current non-destructive evaluation technique analytical justification.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2017

2016
Evaluation of Subsurface Defects Using Diffusion of Motion-Induced Eddy Currents.
IEEE Trans. Instrum. Meas., 2016

2D geometry characterization of cracks from ECT image analysis using planar coils and GMR-sensors.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2016

SVM classification of thickness and lift-off using transient eddy current oscillation method.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2016

2015
Sub-surface defect detection with motion induced eddy currents in aluminium.
Proceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015

ECT image analysis applying an inverse problem algorithm with Tikhonov/TV Regularization.
Proceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015

2014
GMR versus differential coils in velocity induced eddy current testing.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2014

2013
The Lift-Off Effect in Eddy Currents on Thickness Modeling and Measurement.
IEEE Trans. Instrum. Meas., 2013

Velocity induced eddy currents technique to inspect cracks in moving conducting media.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2013

Remote field eddy current inspection of metallic tubes using GMR sensors.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2013

2011
Detection and characterization of defects using GMR probes and artificial neural networks.
Comput. Stand. Interfaces, 2011

A novel uniform eddy current probe with GMR for non destructive testing applications.
Proceedings of EUROCON 2011, 2011

Portable eddy current NDT instrument using two different implementations.
Proceedings of EUROCON 2011, 2011

2010
Liftoff Correction Based on the Spatial Spectral Behavior of Eddy-Current Images.
IEEE Trans. Instrum. Meas., 2010

2008
A Four-Terminal Water-Quality-Monitoring Conductivity Sensor.
IEEE Trans. Instrum. Meas., 2008

2006
Dew Point and Relative-Humidity Smart Measuring System.
IEEE Trans. Instrum. Meas., 2006

2005
Self-organizing maps application in a remote water quality monitoring system.
IEEE Trans. Instrum. Meas., 2005

2004
A virtual instrument to test smart transducer interface modules (STIMs).
IEEE Trans. Instrum. Meas., 2004

2003
Increasing ion Selective Electrodes Performance using Neural Networks.
Int. J. Comput., 2003

Colored light-to-voltage Converters based Absorbance Meter.
Int. J. Comput., 2003

1998
Taxonomic problems on ADC characterisation.
Proceedings of the 5th IEEE International Conference on Electronics, Circuits and Systems, 1998


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