Hein-Mun Lam

According to our database, Hein-Mun Lam authored at least 1 paper in 2013.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2013

Design for manufacturing layout analyses correlate layout to physico-chemical yield loss mechanisms.

Christine P. Tan, Congshu Zhou, Yi Tian, Chang Liu, Hein-Mun Lam, Jian Zhang, Mark Lu

Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013