Heiko Ranzinger

According to our database1, Heiko Ranzinger authored at least 2 papers between 2004 and 2007.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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PhD thesis 
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Links

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Bibliography

2007
Influence of the manufacturing process on the electrical properties of thin (k stacks observed with CAFM.
Microelectron. Reliab., 2007

2004
AFM-based scanning capacitance techniques for deep sub-micron semiconductor failure analysis.
Microelectron. Reliab., 2004


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