Hayk T. Grigoryan

According to our database, Hayk T. Grigoryan authored at least 8 papers between 2011 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications.

Gabriele Boschi, Elisa Spano, Hayk T. Grigoryan, Arun Kumar, Gurgen Harutyunyan

Proceedings of the IEEE International Test Conference, 2020

2019

Innovative Practices on In-System Test and Reliability of Memories.

S. Bandyopadhyay, J. Mekkoth, Marc Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Memory FIT Rate Mitigation Technique for Automotive SoCs.

Gabriele Boschi, Donato Luongo, Duccio Lazzarotti, Hanna Shaheen, Hayk T. Grigoryan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

Proceedings of the IEEE International Test Conference, 2019

Variation-aware Fault Modeling and Test Generation for STT-MRAM.

Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Hayk T. Grigoryan, Grigor Tshagharyan

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

Power Supply Noise Rejection Improvement Method in Modern VLSI Design.

Vazgen Sh. Melikyan, Artur Kh. Mkhitaryan, Hakob T. Kostanyan, Hayk T. Grigoryan, T. Kostanyan Harutyun, Mushegh T. Grigoryan, Ruben H. Musayelyan, Hayk V. Margaryan

Proceedings of the 2019 IEEE East-West Design & Test Symposium, 2019

2018

Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM.

Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian

Proceedings of the IEEE International Test Conference, 2018

Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs.

Hayk T. Grigoryan, Samvel K. Shoukourian, Gurgen Harutyunyan, Yervant Zorian, Costas Argyrides

Proceedings of the IEEE International Test Conference, 2018

2011

Generic BIST architecture for testing of content addressable memories.

Hayk T. Grigoryan, Gurgen Harutunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian

Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011