Harumi Seki
According to our database1,
Harumi Seki
authored at least 3 papers
between 2019 and 2023.
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Bibliography
2023
Comprehensive Analysis of Hole-Trapping in SiN Films with a Wide Range of Time Constants Based on Dynamic C-V.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2020
Further Investigation on Mechanism of Trap Level Modulation in Silicon Nitride Films by Fluorine Incorporation.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2019
Proceedings of the 2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019, 2019