Haruji Futami
According to our database1,
Haruji Futami
authored at least 2 papers
in 2020.
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Bibliography
2020
Proceedings of the 38th IEEE VLSI Test Symposium, 2020
On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test.
Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020