Harry A. Schafft

According to our database, Harry A. Schafft authored at least 4 papers between 2001 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2009

Experimental and simulation studies of resistivity in nanoscale copper films.

A. Emre Yarimbiyik, Harry A. Schafft, Richard A. Allen, Mark D. Vaudin, Mona E. Zaghloul

Microelectron. Reliab., 2009

2006

Modeling and simulation of resistivity of nanometer scale copper.

A. Emre Yarimbiyik, Harry A. Schafft, Richard A. Allen, Mona E. Zaghloul, David L. Blackburn

Microelectron. Reliab., 2006

2003

Early reliability assessment by using deep censoring.

Harry A. Schafft, Linda M. Head, Jason Gill, Timothy D. Sullivan

Microelectron. Reliab., 2003

2001

Improved estimation of the resistivity of pure copper and electrical determination of thin copper film dimensions.

Constance E. Schuster, Mark G. Vangel, Harry A. Schafft

Microelectron. Reliab., 2001