Hari Balachandran

According to our database, Hari Balachandran authored at least 11 papers between 1996 and 2004.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2004

K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits.

Wangqi Qiu, Jing Wang, D. M. H. Walker, Divya Reddy, Zhuo Li, Weiping Shi, Hari Balachandran

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2002

Facilitating Rapid First Silicon Debug.

Hari Balachandran, Kenneth M. Butler, Neil Simpson

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2000

Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs.

Sri Jandhyala, Hari Balachandran, Manidip Sengupta, Anura P. Jayasumana

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

Computer-aided fault to defect mapping (CAFDM) for defect diagnosis.

Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

Logic mapping on a microprocessor.

Anjali Kinra, Hari Balachandran, Regy Thomas, John Carulli

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen.

Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

Clustering based techniques for I_DDQ testing.

Sri Jandhyala, Hari Balachandran, Anura P. Jayasumana

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

Correlation of logical failures to a suspect process step.

Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

Expediting ramp-to-volume production.

Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

On applying non-classical defect models to automated diagnosis.

Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1996

Improvement of SRAM-based failure analysis using calibrated Iddq testing.

Hari Balachandran, D. M. H. Walker

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996