Harald Gossner

According to our database, Harald Gossner authored at least 22 papers between 2001 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2025

System-Efficient ESD Design Based on a Modular Measurement System Applied to USB.

Lucas Speckbacher, David Johannes Pommerenke, Gabriel Fellner, Lukas Pertoll, Harald Gossner

IEEE Trans. Instrum. Meas., 2025

2018

Contact and junction engineering in bulk FinFET technology for improved ESD/latch-up performance with design trade-offs and its implications on hot carrier reliability.

Milova Paul, Boeila Sampath Kumar, Harald Gossner, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

Physics of Current Filamentation in ggNMOS Revisited: Was Our Understanding Scientifically Complete?

Milova Paul, Christian Russ, Boeila Sampath Kumar, Harald Gossner, Mayank Shrivastava

Proceedings of the 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, 2017

2016

A Fully-Integrated Radio-Frequency Power Amplifier in 28nm CMOS Technology Mounted in BGA Package.

Ankur Gupta, Mayank Shrivastava, Maryam Shojaei Baghini, Harald Gossner, V. Ramgopal Rao

Proceedings of the 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, 2016

2015

System efficient ESD design.

Harald Gossner, Charvaka Duvvury

Microelectron. Reliab., 2015

2012

Electronic design automation (EDA) solutions for ESD-robust design and verification.

Michael G. Khazhinsky, Shuqing Cao, Harald Gossner, Gianluca Boselli, Melanie Etherton

Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 2012

2010

System ESD robustness by co-design of on-chip and on-board protection measures.

Harald Gossner, Werner Simbürger, Matthias Stecher

Microelectron. Reliab., 2010

2009

Do ESD fails in systems correlate with IC ESD robustness?

Wolfgang Stadler, Tilo Brodbeck, Reinhold Gärtner, Harald Gossner

Microelectron. Reliab., 2009

Reliability aspects of gate oxide under ESD pulse stress.

Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix

Microelectron. Reliab., 2009

2007

RF ESD protection strategies: Codesign vs. low-C protection.

Wolfgang Soldner, Martin Streibl, U. Hodel, Marc Tiebout, Harald Gossner, Doris Schmitt-Landsiedel, Jung-Hoon Chun, Choshu Ito, Robert W. Dutton

Microelectron. Reliab., 2007

A 10GHz Broadband Amplifier with Bootstrapped 2kV ESD Protection.

Wolfgang Soldner, Moon-Jung Kim, Martin Streibl, Harald Gossner, Thomas H. Lee, Doris Schmitt-Landsiedel

Proceedings of the 2007 IEEE International Solid-State Circuits Conference, 2007

High-Voltage-Tolerant I/O Circuit Design for USB 2.0-Compliant Applications.

Moon-Jung Kim, Henrik Icking, Harald Gossner, Thomas H. Lee

Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, 2007

2006

Circuit design issues in multi-gate FET CMOS technologies.

Christian Pacha, Klaus von Arnim, Thomas Schulz, Weize Xiong, Michael Gostkowski, Gerhard Knoblinger, Andrew Marshall, Thomas Nirschl, Jörg Berthold, Christian Russ, Harald Gossner, Charvaka Duvvury, Paul Patruno, C. Rinn Cleavelin, Klaus Schruefer

Proceedings of the 2006 IEEE International Solid State Circuits Conference, 2006

2005

A Dedicated TLP Set-Up to Investigate the ESD Robustness of RF Elements and Circuits.

Heinrich Wolf, Horst A. Gieser, Wolfgang Soldner, Harald Gossner

Microelectron. Reliab., 2005

High abstraction level permutational ESD concept analysis.

Martin Streibl, Franz Zängl, Kai Esmark, Robert Schwencker, Wolfgang Stadler, Harald Gossner, S. Drüen, Doris Schmitt-Landsiedel

Microelectron. Reliab., 2005

2004

ESD protection for the deep sub micron regime - a challenge for design methodology.

Harald Gossner

Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004

2003

Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies.

Martin Streibl, Kai Esmark, A. Sieck, Wolfgang Stadler, M. Wendel, J. Szatkowski, Harald Gossner

Microelectron. Reliab., 2003

2002

Case study of a technology transfer causing ESD problems.

Franz Zängl, Harald Gossner, Kai Esmark, R. Owen, G. Zimmermann

Microelectron. Reliab., 2002

Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development.

Wolfgang Stadler, Kai Esmark, Harald Gossner, Martin Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, Erich Gornik

Microelectron. Reliab., 2002

2001

Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices.

Martin Litzenberger, R. Pichler, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Kai Esmark, Harald Gossner

Microelectron. Reliab., 2001

Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology.

Harald Gossner, T. Müller-Lynch, Kai Esmark, Matthias Stecher

Microelectron. Reliab., 2001

Advanced 2D/3D ESD device simulation - a powerful tool already used in a pre-Si phase.

Kai Esmark, Wolfgang Stadler, M. Wendel, Harald Gossner, X. Guggenmos, Wolfgang Fichtner

Microelectron. Reliab., 2001