Haralampos-G. D. Stratigopoulos

Hervé Le Gall

J. Electron. Test., 2016

Guest Editors' Introduction: Top Papers from the 2015 International Test Conference.

[BibT_eX]

[DOI]

Nicola Nicolici

IEEE Des. Test, 2016

Practical Simulation Flow for Evaluating Analog/Mixed-Signal Test Techniques.

[BibT_eX]

[DOI]

IEEE Des. Test, 2016

Harnessing fabrication process signature for predicting yield across designs.

[BibT_eX]

[DOI]

Ali Ahmadi

Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

ETS 2016 foreword.

[BibT_eX]

[DOI]

Proceedings of the 21th IEEE European Test Symposium, 2016

Built-in test of millimeter-Wave circuits based on non-intrusive sensors.

[BibT_eX]

[DOI]

Athanasios Dimakos

Alexandre Siligaris

Emeric de Foucauld

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

2015

Exploiting Pipeline ADC Properties for a Reduced-Code Linearity Test Technique.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. I Regul. Pap., 2015

Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors.

[BibT_eX]

[DOI]

Athanasios Dimakos

Alexandre Siligaris

Emeric de Foucauld

J. Electron. Test., 2015

Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE International Test Conference, 2015

Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors.

[BibT_eX]

[DOI]

Athanasios Dimakos

Martin Andraud

Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015

Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion.

[BibT_eX]

[DOI]

Ali Ahmadi

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2015

High frequency jitter estimator for SoCs.

[BibT_eX]

[DOI]

Proceedings of the 20th IEEE European Test Symposium, 2015

Fast deployment of alternate analog test using Bayesian model fusion.

[BibT_eX]

[DOI]

John Liaperdos

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

2014

Fast Monte Carlo-Based Estimation of Analog Parametric Test Metrics.

[BibT_eX]

[DOI]

Stephen Sunter

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

Efficient Monte Carlo-based analog parametric fault modelling.

[BibT_eX]

[DOI]

Stephen Sunter

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Statistical Evaluation of Digital Techniques for $\sum\varDelta$ ADC BIST.

[BibT_eX]

[DOI]

Matthieu Dubois

Proceedings of the VLSI-SoC: Internet of Things Foundations, 2014

Evaluation of digital ternary stimuli for dynamic test of ΣΔ ADCs.

[BibT_eX]

[DOI]

Matthieu Dubois

Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014

Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes.

[BibT_eX]

[DOI]

Josep Altet

Eduardo Aldrete-Vidrio

Paul-Henri Pugliesi-Conti

Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

Solutions for the self-adaptation of communicating systems in operation.

[BibT_eX]

[DOI]

Michel Renovell

Fabien Soulier

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

Low-cost EVM built-in test of RF transceivers.

[BibT_eX]

[DOI]

Ayssar Serhan

Proceedings of the 9th International Design and Test Symposium, 2014

One-Shot Calibration of RF Circuits Based on Non-Intrusive Sensors.

[BibT_eX]

[DOI]

Martin Andraud

Proceedings of the 51st Annual Design Automation Conference 2014, 2014

2013

Reduced-Code Linearity Testing of Pipeline ADCs.

[BibT_eX]

[DOI]

Gerard Bret

IEEE Des. Test, 2013

Reduced code linearity testing of pipeline adcs in the presence of noise.

[BibT_eX]

[DOI]

Gerard Bret

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Defect-oriented non-intrusive RF test using on-chip temperature sensors.

[BibT_eX]

[DOI]

Josep Altet

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Fault modeling and diagnosis for nanometric analog circuits.

[BibT_eX]

[DOI]

Proceedings of the 2013 IEEE International Test Conference, 2013

True non-intrusive sensors for RF built-in test.

[BibT_eX]

[DOI]

Proceedings of the 2013 IEEE International Test Conference, 2013

Multivariate statistical techniques for analog parametric test metrics estimation.

[BibT_eX]

[DOI]

Proceedings of the 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2013

Multidimensional analog test metrics estimation using extreme value theory and statistical blockade.

[BibT_eX]

[DOI]

Pierre Faubet

Yoann Courant

Firas Mohamed

Proceedings of the 50th Annual Design Automation Conference 2013, 2013

2012

Diagnosis of Local Spot Defects in Analog Circuits.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2012

Test Metrics Model for Analog Test Development.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Guest Editors' Introduction: Digitally Enhanced Wireless Transceivers.

[BibT_eX]

[DOI]

Alberto Valdes-Garcia

IEEE Des. Test Comput., 2012

Adaptive Alternate Analog Test.

[BibT_eX]

[DOI]

IEEE Des. Test Comput., 2012

Experiences with non-intrusive sensors for RF built-in test.

[BibT_eX]

[DOI]

Christophe Kelma

Proceedings of the 2012 IEEE International Test Conference, 2012

Enhanced reduced code linearity test technique for multi-bit/stage pipeline ADCs.

[BibT_eX]

[DOI]

Christophe Forel

Proceedings of the 17th IEEE European Test Symposium, 2012

Advances in variation-aware modeling, verification, and testing of analog ICs.

[BibT_eX]

[DOI]

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

Testing RF circuits with true non-intrusive built-in sensors.

[BibT_eX]

[DOI]

Josep Altet

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

2011

Estimation of Analog Parametric Test Metrics Using Copulas.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011

Guest Editorial.

[BibT_eX]

[DOI]

Krishnendu Chakrabarty

J. Electron. Test., 2011

RF Front-End Test Using Built-in Sensors.

[BibT_eX]

[DOI]

Christophe Kelma

IEEE Des. Test Comput., 2011

On proving the efficiency of alternative RF tests.

[BibT_eX]

[DOI]

Nathan Kupp

Petros Drineas

Proceedings of the 2011 IEEE/ACM International Conference on Computer-Aided Design, 2011

Implicit test of high-speed analog circuits using non-intrusive sensors.

[BibT_eX]

[DOI]

Proceedings of the 20th European Conference on Circuit Theory and Design, 2011

On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study.

[BibT_eX]

[DOI]

Alexios Spyronasios

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

RF Specification Test Compaction Using Learning Machines.

[BibT_eX]

[DOI]

Petros Drineas

Mustapha Slamani

IEEE Trans. Very Large Scale Integr. Syst., 2010

Special session 12A: Panel adaptive analog test: Feasibility and opportunities ahead.

[BibT_eX]

[DOI]

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

Special session 8A: TTTC 2010 E. J. McCluskey Best Doctoral Thesis Award.

[BibT_eX]

[DOI]

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

Special session 4C: Thesis research poster session.

[BibT_eX]

[DOI]

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

Density estimation for analog/RF test problem solving.

[BibT_eX]

[DOI]

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

Analog neural network design for RF built-in self-test.

[BibT_eX]

[DOI]

Dzmitry Maliuk

He Huang

Proceedings of the 2011 IEEE International Test Conference, 2010

An analog VLSI multilayer perceptron and its application towards built-in self-test in analog circuits.

[BibT_eX]

[DOI]

Dzmitry Maliuk

Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

Analog test metrics estimates with PPM accuracy.

[BibT_eX]

[DOI]

Proceedings of the 2010 International Conference on Computer-Aided Design, 2010

Sensors for built-in alternate RF test.

[BibT_eX]

[DOI]

Christophe Kelma

Proceedings of the 15th European Test Symposium, 2010

Fault diagnosis of analog circuits based on machine learning.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation and Test in Europe, 2010

Bayesian Fault Diagnosis of RF Circuits Using Nonparametric Density Estimation.

[BibT_eX]

[DOI]

Proceedings of the 19th IEEE Asian Test Symposium, 2010

2009

Evaluation of Analog/RF Test Measurements at the Design Stage.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

Special Session 7C: TTTC 2009 Best Doctoral Thesis Contest.

[BibT_eX]

[DOI]

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Hierarchical parametric test metrics estimation: A ΣΔ converter BIST case study.

[BibT_eX]

[DOI]

Matthieu Dubois

Proceedings of the 27th International Conference on Computer Design, 2009

Defect Filter for Alternate RF Test.

[BibT_eX]

[DOI]

Erkan Acar

Sule Ozev

Proceedings of the 14th IEEE European Test Symposium, 2009

Enrichment of limited training sets in machine-learning-based analog/RF test.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation and Test in Europe, 2009

2008

Error Moderation in Low-Cost Machine-Learning-Based Analog/RF Testing.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008

A Statistical Approach to Characterizing and Testing Functionalized Nanowires.

[BibT_eX]

[DOI]

James Dardig

Eric Stern

Mark A. Reed

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

A General Method to Evaluate RF BIST Techniques Based on Non-parametric Density Estimation.

[BibT_eX]

[DOI]

Jeanne Tongbong

Proceedings of the Design, Automation and Test in Europe, 2008

2007

Non-RF to RF Test Correlation Using Learning Machines: A Case Study.

[BibT_eX]

[DOI]

Petros Drineas

Mustapha Slamani

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

2006

Concurrent detection of erroneous responses in linear analog circuits.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

An adaptive checker for the fully differential analog code.

[BibT_eX]

[DOI]

IEEE J. Solid State Circuits, 2006

Bridging the Accuracy of Functional and Machine-Learning-Based Mixed-Signal Testing.

[BibT_eX]

[DOI]

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

2005

Nonlinear decision boundaries for testing analog circuits.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005

Constructive Derivation of Analog Specification Test Criteria.

[BibT_eX]

[DOI]

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

Generating decision regions in analog measurement spaces.

[BibT_eX]

[DOI]

Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, 2005

2004

An Analog Checker with Input-Relative Tolerance for Duplicate Signals.

[BibT_eX]

[DOI]

J. Electron. Test., 2004

2003

An Analog Checker with Dynamically Adjustable Error Threshold for Fully Differential Circuits.

[BibT_eX]

[DOI]

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

Concurrent Error Detection in Linear Analog Circuits Using State Estimation.

[BibT_eX]

[DOI]