Haoze Luo

According to our database, Haoze Luo authored at least 12 papers between 2015 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Investigation of Off-State Stress Induced Degradation of SiC MOSFETs Under Short-Circuit Condition.

Jianlong Kang, Qing Liu, Haoze Luo, Hu Cao, Zi-Hui Zhang, Zhen Xin

IEEE Trans. Ind. Electron., 2023

2019

AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer.

Kongjing Li, Gui Yun Tian, Xiaotian Chen, Chaoqing Tang, Haoze Luo, Wuhua Li, Bin Gao, Xiangning He, Nick Wright

IEEE Trans. Ind. Electron., 2019

2018

Enabling Junction Temperature Estimation via Collector-Side Thermo-Sensitive Electrical Parameters Through Emitter Stray Inductance in High-Power IGBT Modules.

Haoze Luo, Wuhua Li, Francesco Iannuzzo, Xiangning He, Frede Blaabjerg

IEEE Trans. Ind. Electron., 2018

On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition.

Haoze Luo, Paula Diaz Reigosa, Francesco Iannuzzo, Frede Blaabjerg

Microelectron. Reliab., 2018

Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter.

Lorenzo Ceccarelli, Haoze Luo, Francesco Iannuzzo

Microelectron. Reliab., 2018

2017

Uneven temperature effect evaluation in high-power IGBT inverter legs and relative test platform design.

Haoze Luo, Wuhua Li, Xiangning He, Francesco Iannuzzo, Frede Blaabjerg

Microelectron. Reliab., 2017

Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules.

Haoze Luo, Nick Baker, Francesco Iannuzzo, Frede Blaabjerg

Microelectron. Reliab., 2017

Separation test method for investigation of current density effects on bond wires of SiC power MOSFET modules.

Haoze Luo, Francesco Iannuzzo, Frede Blaabjerg, Wuhua Li, Xiangning He

Proceedings of the IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29, 2017

2016

Modern IGBT gate driving methods for enhancing reliability of high-power converters - An overview.

Haoze Luo, Francesco Iannuzzo, Paula Diaz Reigosa, Frede Blaabjerg, Wuhua Li, Xiangning He

Microelectron. Reliab., 2016

2015

Theoretical Evaluation of Stability Improvement Brought by Resonant Current Loop for Paralleled LLC Converters.

Sheng Zong, Haoze Luo, Wuhua Li, Xiangning He, Changliang Xia

IEEE Trans. Ind. Electron., 2015

Decoupling-Controlled Triport Composited DC/DC Converter for Multiple Energy Interface.

Wuhua Li, Chi Xu, Haoze Luo, Yihua Hu, Xiangning He, Changliang Xia

IEEE Trans. Ind. Electron., 2015

Topology Review and Derivation Methodology of Single-Phase Transformerless Photovoltaic Inverters for Leakage Current Suppression.

Wuhua Li, Yunjie Gu, Haoze Luo, Wenfeng Cui, Xiangning He, Changliang Xia

IEEE Trans. Ind. Electron., 2015