Hao Wang
Orcid: 0000-0002-4271-404XAffiliations:
- Hefei University of Technology, School of Microelectronics, Hefei, China
According to our database1,
Hao Wang
authored at least 4 papers
between 2021 and 2023.
Collaborative distances:
Collaborative distances:
Timeline
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Bibliography
2023
Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets.
J. Electron. Test., June, 2023
2022
J. Electron. Test., 2022
2021
A high-speed and triple-node-upset recovery latch with heterogeneous interconnection.
Microelectron. J., 2021
LC-TSL: A low-cost triple-node-upset self-recovery latch design based on heterogeneous elements for 22 nm CMOS.
Microelectron. J., 2021