Hanyang Xu

According to our database, Hanyang Xu authored at least 8 papers between 2018 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Conductivity Classification of Non-Magnetic Tilting Metals by Eddy Current Sensors.

Yue Du, Zhijie Zhang, Wuliang Yin, Shuang Zhu, Ziqi Chen, Hanyang Xu

Sensors, 2020

Methods of Controlling Lift-Off in Conductivity Invariance Phenomenon for Eddy Current Testing.

Zhongwen Jin, Yuwei Meng, Rongdong Yu, Ruochen Huang, Mingyang Lu, Hanyang Xu, Xiaobai Meng, Qian Zhao, Zhijie Zhang, Anthony J. Peyton, Wuliang Yin

IEEE Access, 2020

A Novel Conductivity Classification Technique for Non-Magnetic Tilting Metals by Eddy Current Sensors.

Yue Du, Zhijie Zhang, Wuliang Yin, Shuang Zhu, Hanyang Xu, Ziqi Chen

IEEE Access, 2020

2019

An Equivalent-Effect Phenomenon in Eddy Current Non-Destructive Testing of Thin Structures.

Wuliang Yin, Jiawei Tang, Mingyang Lu, Hanyang Xu, Ruochen Huang, Qian Zhao, Zhijie Zhang, Anthony J. Peyton

IEEE Access, 2019

Measurement of CFRP surface crack based on electromagnetic measuring system.

Qian Zhao, Kai Zhang, Hanyang Xu, Jorge Ricardo Salas Avila, Lina Zhao, Mingquan Wang, Yan Han, Zhijie Zhang, Wuliang Yin

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2019

Automatic feature extraction method for crack detection in eddy current testing.

Yang Tao, Hanyang Xu, Ziqi Chen, Ruochen Huang, Qiaoye Ran, Qian Zhao, Han Yan, Zhijie Zhang, Wuliang Yin

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2019

Defect Feature Extraction in Eddy Current Testing Based on Convolutional Sparse Coding.

Yang Tao, Hanyang Xu, Jorge R. Salas Avila, Christos Ktistis, Wuliang Yin, Anthony J. Peyton

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2019

2018

A multi-frequency NDT system for imaging and detection of cracks.

Jorge R. Salas Avila, Ziqi Chen, Hanyang Xu, Wuliang Yin

Proceedings of the IEEE International Symposium on Circuits and Systems, 2018