Hans vanMeer

According to our database, Hans vanMeer authored at least 1 paper in 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

CAD utilities to comprehend layout-dependent stress effects in 45 nm high- performance SOI custom macro design.

Akif Sultan, John Faricelli, Sushant Suryagandh, Hans vanMeer, Kaveri Mathur, James Pattison, Sean Hannon, Greg Constant, Kalyana Kumar, Kevin Carrejo, Joe Meier, Rasit Onur Topaloglu, Darin Chan, Uwe Hahn, Thorsten Knopp, Victor Andrade, Bill Gardiol, Steve Hejl, David Wu, James Buller, Larry Bair, Ali Icel, Yuri Apanovich

Proceedings of the 10th International Symposium on Quality of Electronic Design (ISQED 2009), 2009