Hans P. Muhlfeld

According to our database, Hans P. Muhlfeld authored at least 4 papers between 1996 and 1998.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

1998

Cosmic ray soft error rates of 16-Mb DRAM memory chips.

James F. Ziegler, Martin E. Nelson, James Dean Shell, R. Jerry Peterson, Carl J. Gelderloos, Hans P. Muhlfeld, Charles J. Montrose

IEEE J. Solid State Circuits, 1998

1996

Accelerated testing for cosmic soft-error rate.

James F. Ziegler, Hans P. Muhlfeld, Charles J. Montrose, Huntington W. Curtis, Timothy J. O'Gorman, John M. Ross

IBM J. Res. Dev., 1996

IBM experiments in soft fails in computer electronics (1978-1994).

James F. Ziegler, Huntington W. Curtis, Hans P. Muhlfeld, Charles J. Montrose, B. Chin, Michael Nicewicz, C. A. Russell, Wen Y. Wang, Leo B. Freeman, P. Hosier, L. E. LaFave, James L. Walsh, José M. Orro, G. J. Unger, John M. Ross, Timothy J. O'Gorman, B. Messina, Timothy D. Sullivan, A. J. Sykes, Hannon S. Yourke, Thomas A. Enger, Vikram R. Tolat, T. S. Scott, Allen H. Taber, R. J. Sussman, W. A. Klein, C. W. Wahaus

IBM J. Res. Dev., 1996

Field testing for cosmic ray soft errors in semiconductor memories.

Timothy J. O'Gorman, John M. Ross, Allen H. Taber, James F. Ziegler, Hans P. Muhlfeld, Charles J. Montrose, Huntington W. Curtis, James L. Walsh

IBM J. Res. Dev., 1996